British ABI-ChipMaster handheld digital integrated circuit tester product color page download

Cyclic test-more accurate determination of intermittent faulty components

Using unconditional or conditional cyclic test mode, it can find intermittent fault points and faults caused by temperature, and display the diagnostic information of a single pin.

Introduction:

The measurable components include TTL series, CMOS, memory, large-scale integrated circuits, interface chips and other devices with up to 40 pins. There are constantly expanding thousands of component libraries.

Features:

· Simple and convenient operation · Expandable upgrade of the built-in component library · Search of unknown IC model · Display fault diagnosis information of a single pin · Component replacement query · Optional SOIC and PLCC adapters · Optional real-time communication test between programming software and PC · Battery and DC power supply
Features:

Single-Perform a single test on the IC on the test stand.
Loop-regardless of the result, repeat the test
P Loop-If the test result is PASS, repeat the test
F Loop-If the test result is FAIL, repeat the test
Search-Identify the model of the IC on the test stand
Diags-conduct self-diagnostic tests
CmLink-Enter CompactLink software communication mode
Sw Off-Turn off the instrument

Professional CompactLink programming communication software (optional accessory):

Programming software that can expand the component library;
Real-time communication test software with PC;
Allow users to add new component libraries according to the software and generate new functional tests that can meet special applications;
The software uses PremierLink IC programming (PLIP);
High-level test programming description language;
The best analog and digital test procedures;
Can be connected to a computer via RS-232 or USB interface;
This software is suitable for ChipMaster and LinearMaster;